W-2800B SMD Disc Pallet Oscillator Temperature Test System

  • Automated, software-based oscillator, VCXO and TCXO temperature test system
  • Measures over 50 different tests
  • Precision time interval analysis of oscillator startup characteristics
  • Parameter and curve fit characteristics are checked against easy to define QC limits
  • Oscillators of different frequencies can be tested in a single temperature run
  • All data is published in a Microsoft Access™ database
  • Data can be exported to Microsoft Excel™ for custom data analysis
  • Oscillator part number can be used to set complete measurement parameters, QC limits, temperature test points and data printouts
  • Chamber holds four disc palletsfor a total of up to 512 parts
  • Standard SMD sizes available include 2.0x2.5, 2.5x3.2, 3.2x5, 3.5x6, 5x7, 5x7.5, 9x14, DIP (full & half)
  • Measures LVDS, PECL, ECL, CMOS, and TTL devices
  • Load circuitry easily changed via plug-in module


Oscillator Frequency Range: 10 KHz to 1 GHz
Oscilloscope Analog Bandwidth: 600 MHz (rise time 1% error at 5 nsec)
Oscillator X10 Probe Bandwidth: 1 KHz to 850 MHz (2.5 K Ohm Max Impedance)
Oscillator X50 Probe Bandwidth: 1 KHz to 500 MHz (12.5 K Ohm Max Impedance)
Temperature Stability: ±0.1°C
Temperature Uniformity: ±0.6°C
Temperature Range: -55°C to 125°C (MR or LCO2)
-65°C to 125°C (LN2)


  • S&A Probe Test Head
  • S&A 4220 Temperature Test Chamber (LCO2, LN2 or MR option)
  • Oscilloscope
  • 20A Power Supply
  • Printer (optional)
  • Computer (minimum Pentium III, 2 PCI slots, 1 full size PCI slot)
  • S&A MFC-100 Card (requires full size PCI slot)
  • GPIB Card
  • Windows® based System Software