W-2200 Low Frequency Crystal Disc Pallet Temperature Test System

  • Automated software based quartz crystal temperature test
    system for low frequency crystals
  • Up to 2 disc pallets can be stacked
  • Standard sizes available include:
    Type Disc Capacity Total Chamber Capacity
    160 320
    160 320
    DMX-38 100 200
    160 320
    SM-14-J 160 320
    LEADED 100 200
  • Custom sizes available
  • Typical watch crystal measurement time
    of only 2 seconds
  • Measures over 75 different parameters
  • Parameter and curve fit characteristics checked against easy to define QC limits
  • Crystals of different frequencies can be tested in a single temperature run
  • All data published in a Microsoft Access™ database and can be exported to Microsoft Excel™ for custom data analysis
  • Printouts are generated using Crystal Reports®
  • Dual chamber configuration available


150K Ohm Test Head Frequency Range: 10 KHz to 400 KHz
Frequency Correlation: ± 1 ppm at series, typical *
Crystal power: 1 nW to 1 uW into 20,000 Ohms
Temperature Stability: ± 0.1° C
* Proprietary measurement and calibration algorithms provide correlation to industry standard crystal measurement equipment.


  • S&A 250B-1 or 250C Network Analyzer
  • S&A 2451 Switch Controller
    (only required in dual chamber configuration)
  • S&A 4220 Temperature Test Chamber
    (optional LCO2, LN2 or Mechanical Refrigeration Cooling)
  • S&A 150K Ohm Test Head
  • Windows® based System Software
  • Printer (Optional)
  • Computerr Requirements:
    Minimum 500 MHz Pentium III, One full PCI slot with +3.3V & 5V power, Windows 98®